Sub-nanometer probes of surfaces provide important information about chemical and physical properties of materials at atomic level. Microwave microscopy (left) is used to study materials properties at GHz (109 sec-1). This is the frequency range relevant for computers and cell phones, for which the materials are being explored. We show for the first time that one can image atoms at this frequency (right).
Fig. 1: Schematic of microwave microscope
Fig. 2: Atomic resolution images of Au(111) surface resolved in microwave signal
