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Detecting Magnetic Order when Magnetization is Absent
Antiferromagnets are magnetically ordered materials which lack the net magnetization known for ferromagnets. In an antiferromagnet, spins arrange in opposing sublattices with mutually compensating magnetization. Not unlike ferromagnets, antiferromagnets can have domains. In a simple case, the domains are differentiated through spin reversal. Identifying a specific antiferromagnetic domain is a notoriously difficult experimental problem.
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Presenting Undergraduate Research at the National Level
Objective: Train
Utah MRSEC students to effectively present materials research.
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Pulse Inverse Spin-Hall Effect in Organic Semiconductors
Objective: Estimate spin-orbit coupling in in a wide variety of organic semiconductors.
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How many electrons make a nanocrystal film metallic?
Understanding the transport of electrons in films of touching nanocrystals is of central importance for their future use in printed electronic devices such as light emitting diodes, solar cells, or transistors. The research team developed a new theory that describes the transition of the electron conduction in doped nanocrystal films from a semiconducting to a metallic behavior.
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Full Circle of Innovation in Instrumentation: Atomic Level Imaging
A MRSEC innovation comes back home to reveal the atomic structure of new materials
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Wisconsin MRSEC Outreach Impacts 255,000 People This Year!
Since 2011, the Wisconsin MRSEC has created over 40 unique research-inspired education resources. These resources are disseminated through educational kits, outreach activities, instructional videos and other online resources, all based on cutting-edge research going on in the Wisconsin MRSEC.
These resources have impacted:
>650,000 people in 194 countries.
Over the last year:
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MRSEC Shared Facilities: A Vital Resource
The resources of the Wisconsin MRSEC Shared Facilities impact researchers campus-wide and beyond. Over the past year >79,000 usage hours accounted for:
News
Leveraging MRSEC Equipment Purchases
Leveraged
upgrades to Scanning Transmission Electron Microscope (S/TEM) and Focused Ion
Beam System (FIB):
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