An ultrahigh vacuum scanning tunneling microscopy system with in situ surface preparation and analytical facilities has been developed. This system is based upon an Omicron Associates VT-UHV-STM, permitting STM measurements over a broad thermal range (25K - 1400K) on metals, semiconductors, and other conducting thin film surfaces. To make this a more powerful user facility, we have recently implemented a sample/tip load-lock and facilities for in situ sample preparation and chemical deposition. These facilities include a fine focus ion source, metal evaporation sources and thin film monitors, and a liquid doser. A Sun SPARC workstation is dedicated to this system, permitting efficient collection, analysis, and transfer of STM images. This facility is available for collaborative research projects with the MRSEC investigators.