Sub-nanometer probes of surfaces provide important information about chemical and physical properties of materials at atomic level. Microwave microscopy (left) is used to study materials properties at GHz (109 sec-1). This is the frequency range relevant for computers and cell phones, for which the materials are being explored. We show for the first time that one can image atoms at this frequency (right).
Fig. 1: Schematic of microwave microscope
Fig. 2: Atomic resolution images of Au(111) surface resolved in microwave signal
UMD Materials Research Science and Engineering Center (2005)
The Maryland MRSEC carries out nationally recognized fundamental research on surfaces and interfaces of materials with potential impact on the next generation of opto- and nano-electronic devices, and on complex oxides with potential applications in memory, switches, and sensors.