The W. M. Keck Center for Advanced Microscopy and Microanalysis (Keck CAMM) houses two 200 kV field emission transmission electron microscopes (Talos F200C and JEM-2010F), one 300 kV transmission electron microscope (JEM-3010), one 120 kV transmission electron microscope (Tecnai-12), two field emission scanning electron microscopes with FIB-SEM dual beam capability (Auriga 60 and JSM-7400F), and two scanning probe microscopes (Dimension 3100V and Multimode NanoScope V).
See Facility Type below. Additional Facility Types:
In-Situ TEM
Cryo-TEM
Cryo-SEM
Facility Primary Contact: Chaoying Ni
Instrumentation:
Facility URL: