This high sensitivity XPS (Kratos Axis 165) is available for compositional and chemical state analysis of monolayers, thin films, and solid state materials. The system is presently configured with both dual anode(Mg, AlKa) and monochromatized (AlKa) Xray sources. The system has been configured for broad materials applications with the presence of a variable temperature sample stage, charge neutralization system (for insulating samples), ion gun (for depth profiling), and a rapid entry loadlock for high throughput analysis. This facility is operated cooperatively with the Department of Chemistry & Biochemistry.
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