The central NIAC facility has provided materials researchers and industrial clients with electron microscopy imaging and analytical analysis, surface analysis and x-ray diffraction serves for over 25 years. The NIAC houses:
- Dynacool PPMS System
- J.A. Woollam Variable Angle Spectroscopic Ellipsometer (VASE) and Infrared VASE (IR-VASE) systems
- Cameca Local Electrode Atom Probe
- Three scanning electron microscopes with Electron Dispersive X-ray spectrometers
- Four transmission electron microscopes, with Cryo TEM tomography and an FEI Titan aberration corrected (S)TEM
- A surface analysis instrument: a Thermo Fisher k-alpha X-Ray Photoelectron Spectrometer
- Three atomic force microscopes including a Bruker Icon and a Bruker Catalyst BioAFM
- Two dual-beam focused ion beam instruments, including a Plasma Focused Ion Beam
- An Andor Spinning Disk Confocal Microscope
- A confocal micro-Raman spectrometer (Horiba LabRAM HR Evolution)
- A small-angle x-ray diffractometer (SAXS)
- Three additional Diffractometers
- A ZYGO Optical Interferometer
- A Horiba Nanolog spectrofluorometer
- A UV/VIS Dual Beam Fluorometer
For use, questions or more information, please contact the DIrector of MRSEC facilities:
Dr. Jerry Hunter
(608) 263-1073
Instrumentation:
- Bruker D8 Discover Diffractometer X-Ray Diffractometer (XRD)
- Bruker Icon AFM
- Bruker Multimode 8 Atomic Force Microscope (AFM, SPM)
- Cameca IMS-4fE7 Secondary Ion Mass Spectrometer
- Dynacool PPMS
- FEI Titan Aberration-corrected (S)TEM
- Horiba LabRAM HR Evolution Raman Spectrometer
- Hysitron TI950 Triboindenter
- Leica EM TiC 3X Ion Beam Milling System
- Malvern PANalytical X'Pert PRO X-Ray Diffractometer (XRD)
- Micro FT-IR Spectrometer
- NanoMill
- PANalytical Empyrean X-ray diffractometer
- Tecnai TF-30 300KV Field Emission Scanning Transmission Electron Microscope (FE STEM)
- ThermoFisher Helios G4 UX Plasma Focused Ion Beam/Field Emission Scanning Electron Microscope
- Wisconsin MRSEC X-ray Endstation for Nanoscale Transformations (MXNT)
- X-ray Photoelectron Spectrometer (XPS)
- Zeiss Auriga Focused Ion Beam FIB/FESEM
- Zeiss Gemini 300 FESEM
- Zeiss Gemini 450 FESEM
- Zeiss Leo 1530 FESEM/EDS/EBSD
- ZYGO 9000 Optical Profilometer