The Materials Characterization Lab (MCL) is a fully-staffed, user research facility at Penn State’s Materials Research Institute that offers researchers convenient and affordable access to a wide-range of state-of-the-art analytical instrumentation and services.
Instrumentation:
- AES-Physical Electronics 670; 50nm spatial resolution; in situ fracture stage
- AFM-Bruker Dimension Icon; contact mode, tapping mode, peakforce tapping, PFQNM, MFM, PRM, EFM, PFKPFM, and SCM
- AFM-Dimension 3100; contact mode, tapping mode, and phase imaging
- Electrical Characterization-Impedance/Current/Resistance Measuremnets, PE and Strain, Breakdown, Poling Samples
- ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control
- FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration
- FIB-FEI Quanta 200 3D FIB; 3.5nm SEM Resolution, 10nm Ga+ Beam, Pt GIS, and Selective Carbon Etch GIS
- FIB-FEI Helios NanoLab 660; DualBeam SEM/FIB Platform-pushing the limits of extreme high resolution characterization in 2D an 3D, nanoprototyping, and sample preparation
- FTIR-Bruker Hyperion 3000 Microscope; Transmission, Specular Reflectance, ATR, and Relflection Absoprtion
- FTIR-Bruker IFS 66/S and Bruker Vertex V70; Near-IR/Mid-IR/Far-IR, Step Scan, Interchangeable Optical Components
- Nanoindentation-Hysitron TriboIndenter TI 900;
- Optical Profilometer-ZYGO NewView 7300; Surface Topography, Coating Thickness, Step Height, and 3D Imaging
- Particle Sizing-Malvern Mastersizer "S"; Laser Diffraction for Coatings, Ceramics, Cosemetics, Cement, Food, and Clays
- Particle Sizing/Zeta Potential-Malvern Zetasizer ZS; Dynamic Light Scattering for Proteins, Polymers, Micelles, Carbohydrates, Nanoparticles, Colloidal Dispersions, and Emulsions
- Raman-WITec Confocal Raman
- SAXS-Molecular Metrology SAXS
- STEM-FEI Titan 3 G2; 0.7A Resolution, EDS, EELS, and EFTEM
- STEM-JEOL 2010F; 2.0A Resolution, EDS, and EELS
- Surface Area-Gemini 2360 Surface Area Analyer
- Surface Area-Micromeritics ASAP 2020
- Surface Area-Micromeritics ASAP 2920
- TEM-JEOL 2010; 2.3A Resolution, EDS, EELS and EFTEM
- TEM-Phillips 420; 3.4A Resolution with EDS
- TGA-MS-TGA Q50 with a Pfeiffer Vacuum Mass Spectrometer
- UV-VIS-NIR-Perkin-Elmer Lambda 950 UV-VIS NIR Spectrophometer
- XPS-Kratos Analytical Axiz Ultra
- XRD-Multiwire Laue; Back-Reflection Mode for Single Crystal Applications
- XRD-PANalytical Empryean; Reflection Mode for Powder/Bulk Applications
- XRD-PANalytical Xpert Pro MPD; Reflection Mode for Powder/Bulk/Thin Film Applications
- XRD-Phillips MRD; Reflection Mode for Bulk and Thin Film Applications
- XRD-Rigaku DMAX-Rapid II; Reflection or Transmission Mode for Powder/Bulk/Thin Film/Single Crystal Applications
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