Analytical techniques available include Auger spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy, and several kinds of thermal analysis. A wide array of spectrophotometric techniques, including UV-visible-near IR spectrophotometry, Fourier transform infrared spectroscopy, Raman spectroscopy and fluorimetry are also available.
Instrumentation:
- Cary 500i UV-Vis-NIR Dual-Beam Spectrophotometer
- Filmetrics Reflectometer
- Gaertner Scientific 3 Wavelength Variable Angle Ellipsometer
- Harrick Scientific PDC-32G Plasma Cleaner
- Kaiser Optical Hololab 5000R Raman Microscope
- Linkum Scientific FTIR 600 Freezing/Hot stage
- Mettler FP900 Thermosystem Hot stage
- Oriel Instaspec II UV-Vis Spectrograph with Photo Diode Array Detector
- Oxford Instruments Liquid Helium Cryostat
- Perkin Elmer Pyris 1 Differential Scanning Calorimeter
- Physical Electronics Model 700 Scanning Auger Nanoprobe
- Physical Electronics Versaprobe II X-ray Photoelectron Spectrometer
- Sopra Spectroscopic Ellipsometer
- Tencor FLX 2320 Thin Film Stress Measurement System
- Tencor P-16 Surface Profilometer
- Thermo Fisher Continuum Fourier Transform Infrared Microscope
- Thermo Fisher FTIR6700 Fourier Transform Infrared Spectrometer
- Veeco Metrology Nanoscope IV Scanned Probe Microscope Controller with Dimension 3100 SPM
- Veeco Metrology Nanoscope V Scanned Probe Microscope Controller with Dimension 3100 SPM, Hybrid Scanner, and Electrical Characterization Application Modules
- Veeco/Digital Instruments MultiMode SPM
- Veeco/Digital Instruments Nanoscope IIIa Scanned Probe Microscope Controller with Dimension 3000 SPM
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