The Characterization Facility ("CharFac") is a multi-user, shared instrumentation facility for materials research spanning from nanotechnology to biology and medicine. Our analytical capabilities include microscopy via electron beams, force probes and visible light; elemental and chemical imaging including depth profiling; elemental, chemical and mass spectroscopy; atomic and molecular structure analysis via X-ray, ion or electron scattering; nanomechanical and nanotribological probes; and other tools for surface and thin-film metrology. CharFac resides administratively under the College of Science and Engineering with additional support from the Medical School. Well over 100 faculty research programs use our capabilities; these researchers originate from dozens of University of Minnesota departments under several colleges. We also work with some 60 industrial companies in a typical year, ranging from small start-ups to multinational corporations; these interactions include analytical service, training for independent use, and research collaboration. Finally, we are supported by the National Science Foundation as a key node in the National Nanotechnology Infrastructure Network to work with external academic institutions including research universities, 4-year colleges, technical colleges, and K-12 schools
- 2 meter – 2D Area Detector
- 6 meter - 2D Area Detector
- Agilent 5500 environmental SPM plus high-speed force-curve mapping and multifrequency methods
- Agilent 5500 environmental SPM plus inverted light microscope
- Auger Electron Spectroscopy
- Bruker Nanoscope V Multimode 8 with QNM
- Bruker-AXS Microdiffractometer
- Cold Field Emission Gun Scanning Electron Microscope
- Confocal Raman Microscope
- Diffractometer
- Diffractometer
- FEI Tecnai G2 F30
- Field Emission Gun Cryo Transmission Electron Microscope
- Field Emission Gun Scanning Electron Microscope
- Field Emission Gun Scanning Electron Microscope
- Field Emission Gun Transmission Electron Microscope
- Fourier-Transform Infrared Spectrometer (FTIR)
- Ion Beam Analysis
- Microdiffractometer
- micromechanical tester
- Microscopic Contact Angle Meter
- NanoIndenter
- Nanoscope V Multimode 8
- Panalytical X'Pert Pro
- Spectroscopic Ellipsometer
- Tencor P10 Profilometer
- Theta-Theta Diffractometer
- Transmission Electron Microscope
- Transmission Electron Microscope
- Transmission Electron Microscope
- Transmission Electron Microscope
- Triboindenter
- Video-Enhanced Microscope (VEM)
- X-Ray Diffractometer
- X-Ray Diffractometer
- X-ray Photoelectron Spectroscopy (ESCA)
- X-ray Photoelectron Spectroscopy (ESCA)