CRISP High resolution non-contact Atomic Force Microscope (AFM) @ Yale University
May 24, 2009 :: Highlight from IRG I
: B. J. Albers, T. C. Schwendemann, M. Z. Baykara, N. Pilet, E. I. Altman, and U. D. Schwarz, Yale University
Understanding the locations of atoms as they are deposited on a surface is critical for growing interfaces of electronicÂ’ device quality. One unique tool that is key to this endeavor, is the high-resolution, low-temperature ultrahigh vacuum scanning probe microscope for simultaneous operation in noncontact atomic force microscopy and scanning tunneling microscopy mode at 4 K available at CRISP (Yale).
