IRGs

The Yale University CRISP IRG examines complex metal oxide systems and their solid-solid and solid-gas interfaces in order to discover and understand new phenomena and to explore innovative applications for modern electronics and surface chemistry. We consider both the atomic-scale growth and the structural properties of these interfaces, as well as their macroscopic, functional electronic properties. We use two particular research capabilities in which we have unique expertise: the ferroelectric field effect at metallic densities, with which we have successfully controlled the electronic and magnetic properties of correlated electronic systems, and atomic resolution imaging of insulating surfaces using a specialized version of non-contact atomic force microscopy (NC-AFM). This scanning probe approach is used to image defects, charge distributions, and long and short range forces, allowing ferroelectric and magnetic domains to be mapped with unprecedented spatial resolution. These approaches are combined with structural determinations of films and interfaces using transmission electron microscopy (TEM) and x-ray diffraction, with interfacial electronic structure being probed by electron spectroscopies and transport measurements. Our approach also relies heavily on feedback from theory, using first principles calculations to investigate the microscopic structure interface evolution and the resulting macroscopic, electronic functionality.