Masa Ishigami, J.H. Chen, W.G. Cullen, M.S. Fuhrer and E.D. Williams
Nano Lett. Doi: 10.1021/nl070613a (2007)
University of Maryland researchers have used the MRSEC’s SEM-STM facility to show what causes the corrugation of sheets of graphene, thought to be crucial in defining the novel electronic properties of this exciting new electronic material. By comparing the […]
