X-ray SEF @ Massachusetts Institute of Technology
Used for: | X-ray Diffraction |
The X-Ray Diffraction SEF contains a suite of 8 diffractometers for analysis of polycrystalline, single crystal, thin film, polymer, and nanostructured samples.
Instruments available:
Rigaku Powder Diffractometers
Bruker D8 Multipurpose DiffractometerPANalytical Multipurpose Diffractometer
Bruker Single Crystal Diffractometer
Back Reflection Laue Diffractometer
Bede Triple Axis Diffractometer
Bruker Small Angle Diffractometer
Data Analysis Software:
ICDD PDF Database.
MDI Jade
PANalytical X’Pert HighScore Plus
PANalytical X’Pert Data Suite
Bruker DiffracPlus/EVA
Bruker TOPAS
Bruker Shelxtl
Bruker GADDS and SAXS
POPLA
GSAS
PowderCell
Orient Express