X-Ray Diffraction Facility @ Cornell University
Used for: | Polymer Synthesis/ Characterization | Crystallography | X-ray Diffraction | Powder Synthesis and Characterization | Ceramics |
Offering a number of distinct advantages for materials research, this facility houses a small angle X-Ray scattering system (SAXS), a general area diffraction detection system, 2 powder diffractometers, a back-reflection Laue system, and a high-resolution diffractometer. For most samples, very little sample preparation is needed. All types of materials, including polymers, clays, metals, and ceramics can be analyzed. Samples can be in powdered, single crystal, thin film or bulk form. X-Ray techniques are completely non-destructive.
Instruments in this facility include:
Scintag, Inc. Theta-Theta Diffractometer
Philips High Resolution Diffractometer
Multiwire Ltd. Back Reflection Laue
Bruker-Axs Nanostar System
Bruker-AXS General Area Detector Diffraction System (GADDS)
The CCMR facilities are run by expert staff who provide training and technical assistance. We welcome outside users from both industry and academia. Potential users are encouraged to contact us by e-mail or visit the facility on the web.