Scanning Probe Microscopy Facility @ University of Nebraska
Used for: | Scanning Probe Microscopy |
Digital Instruments Nanoscope IIIa Dimension 3100 Scanning Probe Microscopy (SPM) Facility provides nanometer-scale characterization of materials by using Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and Magnetic Force Microscopy (MFM).