Field Emission Transmission Electron Microscope @ University of Maryland
Used for: | Electron Microscopy |
This new field-emission transmission electron microscope (JEOL JEM-2100F) will dramatically improve the campus existing electron microscopy facilities. Under MRSEC support pending with the National Science Foundation, this FEG-TEM will be enhanced with electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDX) capabilities under joint MRSEC support and operate this instrument as a new SEF. This Transmission Electronic Microscope together with the EELS and EDS accessories will provide structural, compositional and phase transformation information with a point-point resolution of <0.2 nm from areas as small as 0.5 nm in diameter.
This microscope is operated jointly with the Department of Material Science and Engineering as part of the Center for Integrated Nanoscale Science and Engineering.