Electron Microscopy @ University of Nebraska
Used for: | Electron Microscopy |
(1) JEOL JEM 2010 transmission electron microscope
200kV, analytical/high-resolution mode, LaB6 filament, single-tilting and double-tilting sample holders. (Oxford EDS system, Gatan dual-view CCD camera, TSL texture analysis system, Digi-TEM beam control system).
(2) JEOL JSM 840A scanning electron microscope
LaB6 filament, second electron and backscattered electron detectors, Kevex Quantum x-ray microanalyzer, Digital imaging system.
(3) VG Microscopes HB501 STEM
Field emission scanning transmission electron microscope, now including:
Windowless x-ray microanalysis (Oxford/ 4pi), Digital image acquisition (4pi), Parallel-acquisi-tion ELLS, Energy-filtered electron diffraction, Differential phase contrast detector, Electron beam induced nanofabrication facility.