Shared Facilities

The Nanoscale Imaging, Spectroscopy and Properties (NISP) Lab is relatively new (less than 3 years) but already contains some excellent equipment that is available to everyone in the University and to government and industry. It is connected to MRSEC via funding and/or other collaborative effort.
NISPLab is dedicated to the characterization of the structure and […]

An ultrahigh vacuum scanning tunneling microscopy system with in situ surface preparation and analytical facilities has been developed. This system is based upon an Omicron Associates VT-UHV-STM, permitting STM measurements over a broad thermal range (25K - 1400K) on metals, semiconductors, and other conducting thin film surfaces. To make this a more powerful user facility, […]

This ultrahigh vacuum facility consists of a scanning electron microscope, atomic force microscope, and scanning tunneling microscope combined in one state-of-the-art instrument (JEOL JSPM-4500A). This instrument allows for multi-scale microscopy at variable temperatures and proximal probe measurements of devices, growth structures and attendant fields. Control electronics are suitable for MFM/EFM measurements and provide scanning Kelvin […]

This high sensitivity XPS (Kratos Axis 165) is available for compositional and chemical state analysis of monolayers, thin films, and solid state materials. The system is presently configured with both dual anode(Mg, AlKa) and monochromatized (AlKa) Xray sources. The system has been configured for broad materials applications with the presence of a variable temperature sample […]

This new facility consists of an SEM (FEI XL-30) for electron-beam lithography, a probe station (Cascade 12000) for electrical characterization, and three scanned-probe microscopes (SPMs) for in situ electrical measurement of devices concurrent with electrostatic force and scanned-gate microscopy. One SPM (DI-Dimension 5000) is configured for electrically contacting samples, and another SPM (JEOL-4210) has controlled […]

This powerful new facility was established under the support of the W. M. Keck Foundation. Combinatorial laser molecular MBE in the Keck Laboratory is used to make thin films of complex magnetic oxides. Materials are synthesized by atomic layer-by-layer deposition processes. The RHEED (reflection of high energy electron diffraction) oscillation is used to monitor the […]

This new field-emission transmission electron microscope (JEOL JEM-2100F) will dramatically improve the campus existing electron microscopy facilities. Under MRSEC support pending with the National Science Foundation, this FEG-TEM will be enhanced with electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDX) capabilities under joint MRSEC support and operate this instrument as a new […]