Shared Facilities

An Accurion EP-3 imaging ellipsometer is available for characterization of thin films. A Langmuir-Blodgett trough accessor is also available for characterization of films formed at the water-air interface. A flow cell accessory can be used with this instument as well.

A Gaertner L116C Ellipsometer is available for characterization of thin films.

A Digital Instruments MMAFM-2 scanning probe microscope is available for surface characterization.

TA Instruments microthermal analyzer

TA Instruments AR2000ex Rheometer. The design of this instrument includes a uniques an ultra-low inertia drag cup motor and porous carbon air bearings for outstanding controlled stress, direct strain and controlled rate performance. The AR2000ex features an original quick-interchanging and self-configuring environmental system. The high resolution optical encoder, high stiffness low inertia […]

The quartz crystal microbalance (QCM) sensor has recently been put into place in the Stanford CPIMA Shared Facilities and is experiencing a surge of use. This sensor is extraordinarily sensitive to mass changes associated with the deposition of material onto the surface of a quartz crystal. These changes are sensed as changes in the natural […]

Seok-Won Lee and W.D. Hinsberg at the IBM Almaden Research Laboratory, working with K. Kanazawa at Stanford University have used a Compensated Phase Locked Oscillator (CPLO) to measure the frequency and resistance changes following the immersion of a lithographic polymer into a solvent. The experimental points are shown as the red circles in the figure […]