Shared Facilities

A Nikon Eclipse TE 2000-U fluorescence is available for thin film characterization.

Two different dielectric/iimpedance analyzers are available for use with the quartz crystal microbalance analyzers. Hewlett-Packard 35670 Dielectric Analyzer.
Agilent 4294A Impedance Analyzer.

This powerful new facility was established under the support of the W. M. Keck Foundation. Combinatorial laser molecular MBE in the Keck Laboratory is used to make thin films of complex magnetic oxides. Materials are synthesized by atomic layer-by-layer deposition processes. The RHEED (reflection of high energy electron diffraction) oscillation is used to monitor the […]

The Materials Preparation Laboratory provides facilities for sample fabrication, processing, patterning and characterization. In response to demands in nanofabrication and synthesis, we have more tightly coupled sample fabrication and characterization by incorporating the previously separate Spectroscopic Facility into the Prep Lab. Key capabilities include: a cleanroom area that houses a Digital Instruments Nanoscope IIIa AFM/STM with capabilities for contact and tapping AFM imaging modes, STM, electro-chemistry, and an environmental sample chamber for in-situ AFM imaging up to +250 °C.

Seok-Won Lee and W.D. Hinsberg at the IBM Almaden Research Laboratory, working with K. Kanazawa at Stanford University have used a Compensated Phase Locked Oscillator (CPLO) to measure the frequency and resistance changes following the immersion of a lithographic polymer into a solvent. The experimental points are shown as the red circles in the figure […]