Shared Facilities

An ultrahigh vacuum scanning tunneling microscopy system with in situ surface preparation and analytical facilities has been developed. This system is based upon an Omicron Associates VT-UHV-STM, permitting STM measurements over a broad thermal range (25K - 1400K) on metals, semiconductors, and other conducting thin film surfaces. To make this a more powerful user facility, […]

This ultrahigh vacuum facility consists of a scanning electron microscope, atomic force microscope, and scanning tunneling microscope combined in one state-of-the-art instrument (JEOL JSPM-4500A). This instrument allows for multi-scale microscopy at variable temperatures and proximal probe measurements of devices, growth structures and attendant fields. Control electronics are suitable for MFM/EFM measurements and provide scanning Kelvin […]

This high sensitivity XPS (Kratos Axis 165) is available for compositional and chemical state analysis of monolayers, thin films, and solid state materials. The system is presently configured with both dual anode(Mg, AlKa) and monochromatized (AlKa) Xray sources. The system has been configured for broad materials applications with the presence of a variable temperature sample […]

Analytical techniques available include Auger spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy, and several kinds of thermal analysis. A wide array of spectrophotometric techniques, including UV-visible-near IR spectrophotometry, Fourier transform infrared spectroscopy, Raman spectroscopy and fluorimetry are also available.

The Center’s research demands state-of-the-art sample surface preparation. Our experiments rely on the ability to prepare very flat, polished surfaces, and to remove very thin sections with a high degree of parallelism. To meet these demands, we have assembled several kinds of polishing, lapping and precision milling instruments. For sectioning of soft metals we have […]

The quartz crystal microbalance (QCM) sensor has recently been put into place in the Stanford CPIMA Shared Facilities and is experiencing a surge of use. This sensor is extraordinarily sensitive to mass changes associated with the deposition of material onto the surface of a quartz crystal. These changes are sensed as changes in the natural […]