Shared Facilities

A Brookhaven Instruments quasi-elastic light scattering apparatus is available for materials characterization at Stanford.

Two surface plasmon spectrometers are available for surface characterization at UC Davis. These instruments are available for use by regular users.

A Woollam spectroscopic ellipsometer is available at UC Davis for characterization of films and surfaces. This instrument is available for use by regular users.

A near field scanning optical microscope (NSOM) is located at UC Davis. This instrument is available for use by regular users.

A Digital Instruments MultiMode atomic force microscope/scanning tunneling microscope (AFM/STM) is located at UC Davis. This instrument is available for use by regular users.

The Integrated Microscopy Facility provides a variety of electron and optical microscopes for imaging small features and for microanalysis of the elemental composition of materials. The facility is operated by three expert managers who have many years of combined experience in advanced microscopy.
Instruments in this facility include:
Leica 440 SEM: 4.5 nm resolution at 30KV. […]

FUNCTION:
The Surface Science Facility provides multiple-technique characterization of a variety of surfaces with regard to atomic structure, surface chemical composition, and chemical bonding characteristics.
EQUIPMENT:
1. PHI 590A Scanning Auger Microprobe: This scanning Auger microprobe is capable of standard Auger analysis with 200 nm lateral resolution and provides composition information in the top few atomic layers with […]

The Materials Facility is a multi-function and multi-purpose Research Support Facility providing a wide spectrum of services and apparatus for materials testing, preparation, and characterization.
It is the philosophy of the facility to have close interaction between staff and users. Hands-on involvement of students is stressed at the expense of wear and tear on the equipment […]

The goal of the MOCSI Facility (known informally as the Surface Facility) is to provide tools that can generate images of surface or near-surface characteristics, such as topography or electronic structure, at length scales from microns down to nanometers in environments ranging from ultra-high vacuum to fluids. The primary tools are specialized scanning probe microscopes […]

The Characterization Facility (”CharFac”) is a multi-user, shared instrumentation facility for materials research spanning from nanotechnology to biology and medicine. Our analytical capabilities include microscopy via electron beams, force probes and visible light; elemental and chemical imaging including depth profiling; elemental, chemical and mass spectroscopy; atomic and molecular structure analysis via X-ray, ion or […]