Shared Facilities

(1) Spin-polarized inverse photoemission and angle-resolved inverse photoemission
(2) UV and Soft X-ray CVD
(3) ESCA and angle-resolved XPS

This high sensitivity XPS (Kratos Axis 165) is available for compositional and chemical state analysis of monolayers, thin films, and solid state materials. The system is presently configured with both dual anode(Mg, AlKa) and monochromatized (AlKa) Xray sources. The system has been configured for broad materials applications with the presence of a variable temperature sample […]

Supervisors: Professors Irving P. Herman and Rasti Levicky
The direct contact for this ellipsometer is Shengguo Jia at 212-854-6666. Please contact Eric Holihan at 212-854-0260 for scheduling and training information.
The Beaglehole Spectroscopic and Imaging System can be configured and operated as an:
1.
Ellipsometer (picometer) in a single region, […]