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Shared Facilities

Shared Facilities :: Scanning Probe Microscopy

Materials Facilities @ Cornell University

| Surface Preparation/ Characterization | Thin Film Fabrication and Characterization | Materials Processing/ Preparation | Spectroscopy | Coatings/Film Fabrication | Optical Microscopy | Thermal/ Mechanical Analysis | CVD | Mechanical Testing | Ceramics | Polymer Processing |

The Materials Facility is a multi-function and multi-purpose Research Support Facility providing a wide spectrum of services and apparatus for materials testing, preparation, and characterization.
It is the philosophy of the facility to have close interaction between staff and users. Hands-on involvement of students is stressed at the expense of wear and tear on the equipment […]

Surface Facility @ Cornell University

| Surface Preparation/ Characterization | Spectroscopy | Optical Microscopy | Image Analysis and Processing | Molecular IR Imaging |

The goal of the MOCSI Facility (known informally as the Surface Facility) is to provide tools that can generate images of surface or near-surface characteristics, such as topography or electronic structure, at length scales from microns down to nanometers in environments ranging from ultra-high vacuum to fluids. The primary tools are specialized scanning probe microscopes […]

Scanning Probe Microscope @ Stanford/ IBM ARC/ UC Davis/ UC Berkeley

A Digital Instruments MMAFM-2 scanning probe microscope is available for surface characterization.

Scanning Probe Microscopy Facility @ University of Nebraska

Digital Instruments Nanoscope IIIa Dimension 3100 Scanning Probe Microscopy (SPM) Facility provides nanometer-scale characterization of materials by using Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and Magnetic Force Microscopy (MFM).

Institute of Technology Characterization Facility @ University of Minnesota

| Electron Microscopy | Surface Preparation/ Characterization | Atom probe | CVD | Electron Microprobe | Environmental Scanning Electron Microscopy | Focused Ion Beam | Low Energy Electron Microscope | Near Field Scanning Microwave Microscope | Rutherford Backscattering |

The Characterization Facility (”CharFac”) is a multi-user, shared instrumentation facility for materials research spanning from nanotechnology to biology and medicine. Our analytical capabilities include microscopy via electron beams, force probes and visible light; elemental and chemical imaging including depth profiling; elemental, chemical and mass spectroscopy; atomic and molecular structure analysis via X-ray, ion or […]

Variable Temperature UHV Scanning Tunneling Microscope @ University of Maryland

Surface Preparation/ Characterization |

An ultrahigh vacuum scanning tunneling microscopy system with in situ surface preparation and analytical facilities has been developed. This system is based upon an Omicron Associates VT-UHV-STM, permitting STM measurements over a broad thermal range (25K - 1400K) on metals, semiconductors, and other conducting thin film surfaces. To make this a more powerful user facility, […]

Scanning Electron Microscopy/Scanning Tunneling Microscopy/Atomic Force Microscopy Facility (UHV-SEM/STM/AFM) @ University of Maryland

Electron Microscopy | Surface Preparation/ Characterization |

This ultrahigh vacuum facility consists of a scanning electron microscope, atomic force microscope, and scanning tunneling microscope combined in one state-of-the-art instrument (JEOL JSPM-4500A). This instrument allows for multi-scale microscopy at variable temperatures and proximal probe measurements of devices, growth structures and attendant fields. Control electronics are suitable for MFM/EFM measurements and provide scanning Kelvin […]

Materials Preparation Laboratory @ University of Chicago

Electron Microscopy | Thin Film Fabrication and Characterization | Materials Processing/ Preparation | Microfabrication / Microelectronics / Clean Room | Coatings/Film Fabrication | Optical Microscopy |

The Materials Preparation Laboratory provides facilities for sample fabrication, processing, patterning and characterization. In response to demands in nanofabrication and synthesis, we have more tightly coupled sample fabrication and characterization by incorporating the previously separate Spectroscopic Facility into the Prep Lab. Key capabilities include: a cleanroom area that houses a Digital Instruments Nanoscope IIIa AFM/STM with capabilities for contact and tapping AFM imaging modes, STM, electro-chemistry, and an environmental sample chamber for in-situ AFM imaging up to +250 °C.