Shared Facilities

High resolution field emission cold cathode scanning electron microscope with semi-in-lens detector configuration achieving resolution down to 2 nm. It is equipped with BE (backscattered) detector and thin window energy dispersive X-ray spectrometer (EDS) from Princeton Gamma-Tech for compositional analysis, imaging and mapping. Fully digital image acquisition.

During the past four years, UA has installed over $5M of new instrumentation in UA’s CAF. These instruments were obtained through NSF-sponsored Major Research Instrumentation (MRI) awards in 2003, 2004 and 2007 as well as internal investments at UA. The CAF is a general user facility managed by Dr. Mike Bersch (director), Dr. Mohammed Shamsuzzoha […]

The OIM consists of a Philips XL40 FEGSEM, equipped with a large specimen chamber and a Peltier cooled CCD camera for acquisition of electron backscattering patterns. The camera mount has also been upgraded to a stepper motor driven screw drive, allowing the camera position to be controlled to meet the diffraction requirements of the experiment. […]

The Integrated Microscopy Facility provides a variety of electron and optical microscopes for imaging small features and for microanalysis of the elemental composition of materials. The facility is operated by three expert managers who have many years of combined experience in advanced microscopy.
Instruments in this facility include:
Leica 440 SEM: 4.5 nm resolution at 30KV. […]

Main equipment:
(1) JEOL JEM 2010 Transmission Electron Microscope
(2) JEOL JSM 840A Scanning Electron Microscope
(3) VG Microscopes HB501 STEM

The Characterization Facility (”CharFac”) is a multi-user, shared instrumentation facility for materials research spanning from nanotechnology to biology and medicine. Our analytical capabilities include microscopy via electron beams, force probes and visible light; elemental and chemical imaging including depth profiling; elemental, chemical and mass spectroscopy; atomic and molecular structure analysis via X-ray, ion or […]

This ultrahigh vacuum facility consists of a scanning electron microscope, atomic force microscope, and scanning tunneling microscope combined in one state-of-the-art instrument (JEOL JSPM-4500A). This instrument allows for multi-scale microscopy at variable temperatures and proximal probe measurements of devices, growth structures and attendant fields. Control electronics are suitable for MFM/EFM measurements and provide scanning Kelvin […]

This new field-emission transmission electron microscope (JEOL JEM-2100F) will dramatically improve the campus existing electron microscopy facilities. Under MRSEC support pending with the National Science Foundation, this FEG-TEM will be enhanced with electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDX) capabilities under joint MRSEC support and operate this instrument as a new […]

This facility has equipment for both Transmission Electron Microscopy (TEM), which allows the researcher to form images of thin slices or finely divided powders of samples at a resolution of down to 0.18nm, and for Scanning Electron Microscopy (SEM), a tool for visualizing the surface of solid samples with a resolution that can approach 1nm.

The Materials Preparation Laboratory provides facilities for sample fabrication, processing, patterning and characterization. In response to demands in nanofabrication and synthesis, we have more tightly coupled sample fabrication and characterization by incorporating the previously separate Spectroscopic Facility into the Prep Lab. Key capabilities include: a cleanroom area that houses a Digital Instruments Nanoscope IIIa AFM/STM with capabilities for contact and tapping AFM imaging modes, STM, electro-chemistry, and an environmental sample chamber for in-situ AFM imaging up to +250 °C.