Shared Facilities

The OIM consists of a Philips XL40 FEGSEM, equipped with a large specimen chamber and a Peltier cooled CCD camera for acquisition of electron backscattering patterns. The camera mount has also been upgraded to a stepper motor driven screw drive, allowing the camera position to be controlled to meet the diffraction requirements of the experiment. […]

Scanning Auger Electron Microscopy Laboratory
This facility consists of a PHI Model 600 scanning Auger microprobe (SAM). Recently, the instrument was upgraded with a modern PC based computer, new controlling electronic modules, and new software that improves our capabilities to acquire, process, and transmit the data. In early 2003, we plan another software upgrade that will […]

The Center’s research demands state-of-the-art sample surface preparation. Our experiments rely on the ability to prepare very flat, polished surfaces, and to remove very thin sections with a high degree of parallelism. To meet these demands, we have assembled several kinds of polishing, lapping and precision milling instruments. For sectioning of soft metals we have […]