Analysis SEF @ Massachusetts Institute of Technology
Used for: | Surface Preparation/ Characterization |
Analytical techniques available include Auger spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy, and several kinds of thermal analysis. A wide array of spectrophotometric techniques, including UV-visible-near IR spectrophotometry, Fourier transform infrared spectroscopy, Raman spectroscopy and fluorimetry are also available.
Instruments Available:
Microscopy
Zeiss Axioplan Optical Microscope
Zeiss Ultraphot Optical Microscope
MultiMode Microscope
Tipview Microscope
Kratos AXIS Ultra Imaging X-ray Photoelectron Spectrometer
VECCO Metrology Nanoscope IV/Dimension 3100 Scanning Probe Microscope
Dimension 3100 Microscope
Photon Technology Int. QM-6/2006 Spectrofluorimeter
Thermal Analysis:
Perkin Elmer Pyris 1 Differential Scanning Calorimeter
Perkin Elmer PSI Differential Scanning Calorimeter
Perkin Elmer DTA7 Differential Thermal Analyzer
Perkin Elmer TGA7 Thermogravimetric Analyzer
Seiko DMS 110 Dynamic Mechanical Analyzer
Seiko Dual TG/DTA 320 Thermogravimetric/Differential Thermal Analyzer
Tencor FLX 2320 Thin Film Stress Measurement System
Mettler FP900 Thermosystem Hotstage
Perkin Elmer 2Z Auto Balance
Oxford Instruments Liquid Helium Cryostat
Linkum Scientific FTIR 600 Freezing/Hotstage
Thin Film Instrumentation:
Sharon Vacuum Thermal Co-Evaporator
Tencor FLX 2320 Thin Film Stress Measurement System
Tencor P-10 Surface Profilometer
Gaertner Scientific 3-Wavelength Variable Angle Ellipsometer
Filmetrics Reflectometer
Ultraviolet, Visible, and Infrared Spectroscopic Analysis:
Cary 5E UV-Vis-NIR Dual-Beam Spectrophotometer
Cary 500i UV-Vis-NIR Dual-Beam Spectrophotometer
Oriel Instaspec II UV-Vis Spectrograph with Photo Diode Array Detector
Nicolet Magna 860 Fourier Transform Infrared Spectrometer
Kaiser Hololab 5000R Raman Spectrometer